document.write("");
document.write("
Chobola,\ T.\ ; Müller,\ G.*\ ; Dausmann,\ V.*\ ; Theileis,\ A.*\ ; Taucher,\ J.*\ ; Huisken,\ J.*\ ; Peng,\ T.
");
document.write("
");
document.write("
IEEE Xplore, 3876-3885 (2023)
");
document.write("
");
document.write("
Abdollahi,\ H.*\ ; Nabaei,\ M.*\ ; Ahookhosh,\ K.*\ ; Babamiri,\ A.*\ ; Farnoud,\ A.
");
document.write("
");
document.write("
IEEE Xplore, 28-33 (2022)
");
document.write("
");
document.write("
Rezaei,\ M.*\ ; Dorigatti,\ E.\ ; Rügamer,\ D.*\ ; Bischl,\ B.*
");
document.write("
");
document.write("
IEEE Xplore, 55-62 (2022)
");
document.write("
");
document.write("
Hong,\ D.*\ ; He,\ W.*\ ; Yokoya,\ N.*\ ; Yao,\ J.*\ ; Gao,\ L.*\ ; Zhang,\ L.*\ ; Chanussot,\ J.*\ ; Zhu,\ X.X.*
");
document.write("
");
document.write("
IEEE Xplore, accepted (2021)
");
document.write("
");
document.write("
Schiffer,\ C.*\ ; Harmeling,\ S.*\ ; Amunts,\ K.*\ ; Dickscheid,\ T.*
");
document.write("
");
document.write("
IEEE Xplore, accepted (2021)
");
document.write("
");
document.write("
Götz,\ M.*\ ; Debus,\ C.*\ ; Coquelin,\ D.*\ ; Krajsek,\ K.*\ ; Comito,\ C.*\ ; Knechtges,\ P.*\ ; Hagemeier,\ B.*\ ; Tarnawa,\ M.*\ ; Hanselmann,\ S.*\ ; Siggel,\ M.*\ ; Basermann,\ A.*\ ; Streit,\ A.*
");
document.write("
");
document.write("
IEEE Xplore, accepted (2020)
");
document.write("