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Engel,\ L.*\ ; Mueller,\ J.*\ ; Rendon,\ E.J.F.*\ ; Dorschky,\ E.*\ ; Krauss,\ D.*\ ; Ullmann,\ I.*\ ; Eskofier,\ B.M.\ ; Vossiek,\ M.*
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IEEE J. Microw. 5, 373-387 (2025)
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