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Unsupervised pathology detection: A deep dive Into the state of the art.
IEEE Trans. Med. Imaging 43, 241-252 (2024)
Deep unsupervised approaches are gathering increased attention for applications such as pathology detection and segmentation in medical images since they promise to alleviate the need for large labeled datasets and are more generalizable than their supervised counterparts in detecting any kind of rare pathology. As the Unsupervised Anomaly Detection (UAD) literature continuously grows and new paradigms emerge, it is vital to continuously evaluate and benchmark new methods in a common framework, in order to reassess the state-of-the-art (SOTA) and identify promising research directions. To this end, we evaluate a diverse selection of cutting-edge UAD methods on multiple medical datasets, comparing them against the established SOTA in UAD for brain MRI. Our experiments demonstrate that newly developed feature-modeling methods from the industrial and medical literature achieve increased performance compared to previous work and set the new SOTA in a variety of modalities and datasets. Additionally, we show that such methods are capable of benefiting from recently developed self-supervised pre-training algorithms, further increasing their performance. Finally, we perform a series of experiments in order to gain further insights into some unique characteristics of selected models and datasets. Our code can be found under https://github.com/iolag/UPD_study/.
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Publikationstyp
Artikel: Journalartikel
Dokumenttyp
Wissenschaftlicher Artikel
Schlagwörter
Anomaly detection; Medical diagnostic imaging; Image reconstruction; Pathology; Feature extraction; Training; Task analysis; Unsupervised; anomaly; detection; segmentation; medical; comparative; generative; image-reconstruction; feature-modeling; self-supervised; pre-training; Anomaly Detection; Segmentation
ISSN (print) / ISBN
0278-0062
e-ISSN
1558-254X
Zeitschrift
IEEE Transactions on Medical Imaging
Quellenangaben
Band: 43,
Heft: 1,
Seiten: 241-252
Verlag
Institute of Electrical and Electronics Engineers (IEEE)
Verlagsort
New York, NY [u.a.]
Nichtpatentliteratur
Publikationen
Begutachtungsstatus
Peer reviewed
Institut(e)
Institute for Machine Learning in Biomed Imaging (IML)
Förderungen
Munich Center for Machine Learning