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Possible occurrence of DNA double-strand breaks during repair of u.v.-induced damage in yeast.
Int. J. Radiat. Biol. 52, 107-113 (1987)
The yeast mutant rad54-3, which is temperature conditional for dsb rejoining, is sensitive to u.v. light when held at the restrictive temperature following exposure. We propose that this is attributable to the enzymatic formation of dsb in DNA containing u.v. lesions and a subsequent lack of dsb repair in this mutant.
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Publikationstyp
Artikel: Journalartikel
Dokumenttyp
Wissenschaftlicher Artikel
ISSN (print) / ISBN
0955-3002
e-ISSN
1362-3095
Zeitschrift
International Journal of Radiation Biology
Quellenangaben
Band: 52,
Heft: 1,
Seiten: 107-113
Verlag
Informa Healthcare
Begutachtungsstatus
Peer reviewed
Institut(e)
Abteilung Biophysikalische Strahlenforschung