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Tischenko, O. ; Xu, Y.* ; Goetzfried, T.* ; Bogner, L.* ; Hoeschen, C.

Reduction of aliasing artifacts in tomographic images.

Proc. SPIE 7258:72583F (2009)
DOI
Open Access Green möglich sobald Postprint bei der ZB eingereicht worden ist.
Refining the sampling geometry of a CT scanner is a standard approach used for reduction of aliasing artifacts in CT images. Although this leads to reduction of the artifacts, the principal problem of aliasing streaks artifacts remains unsolved. A different approach is proposed, which in some special cases can solve the problem very efficiently. It is shown that under certain specific conditions, the sum of images reconstructed from the data collected within different sampling geometries is free of aliasing. These conditions are studied and practical situations where they can be realized are discussed.
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Publikationstyp Artikel: Journalartikel
Dokumenttyp Wissenschaftlicher Artikel
Herausgeber Samei, E.* ; Hsieh, J.*
Korrespondenzautor
Schlagwörter CT; Tomography; Aliasing; Artifacts
ISSN (print) / ISBN 0277-786X
e-ISSN 1996-756X
Zeitschrift Proceedings of SPIE
Quellenangaben Band: 7258, Heft: , Seiten: , Artikelnummer: 72583F Supplement: ,
Reihe Proceedings of SPIE
Verlag SPIE
Verlagsort Bellingham, WA
Nichtpatentliteratur Publikationen
Begutachtungsstatus Peer reviewed
Institut(e) Institute of Radiation Protection (ISS)