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Open Access Green möglich sobald Postprint bei der ZB eingereicht worden ist.
On the OSL curve shape and preheat treatment of electronic components from portable electronic devices.
Radiat. Meas. 45, 746-748 (2010)
The shape of the OSL decay curve and the effect of longer time delays between accidental exposure and readout of alumina-rich electronic components from portable electronic devices are investigated. The OSL decay curve follows a hyperbolic decay function, which is interpreted as an approximation of several closely spaced or even a continuous distribution of single trap OSL decay functions. Longer time delays between exposure and readout lead to a rising dose vs. OSL integration time plot, when applying a low preheat. Supplementary TL investigations indicate a distribution in activation energies for the main dosimetric (190 degrees C) peak and that the lower temperature part could fade with a higher rate than the higher temperature part. Consequences for the applied preheat treatment prior to dose measurement are discussed.
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Publikationstyp
Artikel: Journalartikel
Dokumenttyp
Wissenschaftlicher Artikel
Schlagwörter
Accident dosimetry; Retrospective dosimetry; Portable electronic devices; Emergency dosimeter; Optically stimulated luminescence; Thermoluminescence
ISSN (print) / ISBN
1350-4487
e-ISSN
1879-0925
Zeitschrift
Radiation Measurements
Quellenangaben
Band: 45,
Heft: 3-6,
Seiten: 746-748
Verlag
Elsevier
Begutachtungsstatus
Peer reviewed
Institut(e)
Institute of Radiation Protection (ISS)