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Bangun, A.* ; Melnyk, O. ; Marz, B.* ; Diederichs, B.* ; Clausen, A.* ; Weber, D.* ; Filbir, F. ; Muller-Caspary, K.*

Inverse multislice ptychography by layer-wise optimisation and sparse matrix decomposition.

IEEE Trans. Comput. Imaging 8, 996-1011 (2022)
Verlagsversion DOI
Open Access Gold (Paid Option)
Creative Commons Lizenzvertrag
We propose algorithms based on an optimisation method for inverse multislice ptychography in, e.g. electron microscopy. The multislice method is widely used to model the interaction between relativistic electrons and thick specimens. Since only the intensity of diffraction patterns can be recorded, the challenge in applying inverse multislice ptychography is to uniquely reconstruct the electrostatic potential in each slice up to some ambiguities. In this conceptual study, we show that a unique separation of atomic layers for simulated data is possible when considering a low acceleration voltage. We also introduce an adaptation for estimating the illuminating probe. For the sake of practical application, we finally present slice reconstructions using experimental 4D scanning transmission electron microscopy (STEM) data.
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Publikationstyp Artikel: Journalartikel
Dokumenttyp Wissenschaftlicher Artikel
Korrespondenzautor
Schlagwörter Electron Microscopy ; Multislice Method ; Phase Retrieval ; Ptychography
ISSN (print) / ISBN 2333-9403
e-ISSN 2333-9403
Zeitschrift IEEE Transactions on Computational Imaging
Quellenangaben Band: 8, Heft: , Seiten: 996-1011 Artikelnummer: , Supplement: ,
Verlag IEEE
Nichtpatentliteratur Publikationen
Begutachtungsstatus Peer reviewed
Institut(e) Institute of Biological and Medical Imaging (IBMI)
Helmholtz AI - FZJ (HAI - FZJ)