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Stefanoiu, A.* ; Page, J.* ; Symvoulidis, P. ; Westmeyer, G.G. ; Lasser, T.*

Artifact-free deconvolution in light field microscopy.

Opt. Express. 27, 31644-31666 (2019)
Verlagsversion DOI PMC
Open Access Gold
Creative Commons Lizenzvertrag
The sampling patterns of the light field microscope (LFM) are highly depth-dependent, which implies non-uniform recoverable lateral resolution across depth. Moreover, reconstructions using state-of-the-art approaches suffer from strong artifacts at axial ranges, where the LFM samples the light field at a coarse rate. In this work, we analyze the sampling patterns of the LFM, and introduce a flexible light field point spread function model (LFPSF) to cope with arbitrary LFM designs. We then propose a novel aliasing-aware deconvolution scheme to address the sampling artifacts. We demonstrate the high potential of the proposed method on real experimental data.
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Publikationstyp Artikel: Journalartikel
Dokumenttyp Wissenschaftlicher Artikel
Korrespondenzautor
Schlagwörter Image-reconstruction
ISSN (print) / ISBN 1094-4087
e-ISSN 1094-4087
Zeitschrift Optics Express
Quellenangaben Band: 27, Heft: 22, Seiten: 31644-31666 Artikelnummer: , Supplement: ,
Verlag Optical Society of America (OSA)
Verlagsort 2010 Massachusetts Ave Nw, Washington, Dc 20036 Usa
Nichtpatentliteratur Publikationen
Begutachtungsstatus Peer reviewed
Institut(e) Institute of Biological and Medical Imaging (IBMI)
Institute of Developmental Genetics (IDG)