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Possible occurrence of DNA double-strand breaks during repair of u.v.-induced damage in yeast.
Int. J. Radiat. Biol. 52, 107-113 (1987)
The yeast mutant rad54-3, which is temperature conditional for dsb rejoining, is sensitive to u.v. light when held at the restrictive temperature following exposure. We propose that this is attributable to the enzymatic formation of dsb in DNA containing u.v. lesions and a subsequent lack of dsb repair in this mutant.
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Publication type
Article: Journal article
Document type
Scientific Article
ISSN (print) / ISBN
0955-3002
e-ISSN
1362-3095
Quellenangaben
Volume: 52,
Issue: 1,
Pages: 107-113
Publisher
Informa Healthcare
Reviewing status
Peer reviewed
Institute(s)
Abteilung Biophysikalische Strahlenforschung