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Comparing interface dosimetry with conventional methods and TSEE.

Radiat. Prot. Dosim. 4, 174-176 (1983)
DOI
Open Access Green as soon as Postprint is submitted to ZB.
Dose enhancement factors at plane TEM/metal interfaces have experimentally been determined for photon beams. The measurements were performed ionometrically and, for comparison, with solid state dosemeters. Emphasis was given to TSEE allowing for transition-zone dosimetry on a near-microscopic scale. Dose enhancement of as much as 58 directs interest towards radiological and technical applications.
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Publication type Article: Journal article
Document type Scientific Article
Language english
Publication Year 1983
HGF-reported in Year 0
ISSN (print) / ISBN 0144-8420
e-ISSN 1742-3406
Quellenangaben Volume: 4, Issue: 3-4, Pages: 174-176 Article Number: , Supplement: ,
Publisher Oxford University Press
Publishing Place Oxford
Reviewing status Peer reviewed
Scopus ID 0021060826
Erfassungsdatum 1983-12-30