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Weier -, H.U.G.
;
Eisert, W.G.
Two-parameter data-acquisition system for slit-scan chromosome analysis.
Rev. Sci. Instruments
57
, 2902 (1986)
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Transient digitizers based on RCA flash converters are used to record two-parameter data for chromosome analysis.
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Article: Journal article
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0034-6748
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1089-7623
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Review of Scientific Instruments
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Volume: 57,
Issue: 11,
Pages: 2902
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American Institute of Physics (AIP)
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