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Schmid, T.E. ; Greubel, C.* ; Ilicic, K.* ; Walsh, D.W.M.* ; Reindl, J.* ; Siebenwirth, C.* ; Sammer, M.* ; Wilkens, J.J.* ; Multhoff, G.* ; Dollinger, G.* ; Schmid, E.* ; Combs, S.E.

Submicrometer focusing of low LET protons - understanding the RBE of heavy ion irradiation.

Strahlenther. Onkol. 193, S104-S105 (2017)
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Publication type Article: Journal article
Document type Meeting abstract
Corresponding Author
ISSN (print) / ISBN 0179-7158
e-ISSN 1439-099X
Quellenangaben Volume: 193, Issue: , Pages: S104-S105 Article Number: , Supplement: ,
Publisher Urban & Vogel
Publishing Place Heidelberg
Non-patent literature Publications
Reviewing status Peer reviewed