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Sample-averaged biexciton quantum yield measured by solution-phase photon correlation.
Nano Lett. 14, 6792-6798 (2014)
The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average biexciton-to-exciton quantum yield ratio of an entire sample without user selection bias. This technique can be used to investigate the multiexciton recombination dynamics of a broad scope of synthetically underdeveloped materials, including those with low exciton quantum yields and poor fluorescence stability. Here, we have applied this method to measure weak biexciton fluorescence in samples of visible-emitting InP/ZnS and InAs/ZnS core/shell nanocrystals, and to demonstrate that a rapid CdS shell growth procedure can markedly increase the biexciton fluorescence of CdSe nanocrystals.
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Publication type
Article: Journal article
Document type
Scientific Article
Keywords
Photon Correlation ; Multiexcitons ; Semiconductor Nanocrystals ; Single-molecule Spectroscopy
ISSN (print) / ISBN
1530-6984
e-ISSN
1530-6992
Journal
Nano Letters
Quellenangaben
Volume: 14,
Issue: 12,
Pages: 6792-6798
Publisher
American Chemical Society (ACS)
Non-patent literature
Publications
Reviewing status
Peer reviewed
Institute(s)
Helmholtz Pioneer Campus (HPC)