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Open Access Green as soon as Postprint is submitted to ZB.
On the OSL curve shape and preheat treatment of electronic components from portable electronic devices.
Radiat. Meas. 45, 746-748 (2010)
The shape of the OSL decay curve and the effect of longer time delays between accidental exposure and readout of alumina-rich electronic components from portable electronic devices are investigated. The OSL decay curve follows a hyperbolic decay function, which is interpreted as an approximation of several closely spaced or even a continuous distribution of single trap OSL decay functions. Longer time delays between exposure and readout lead to a rising dose vs. OSL integration time plot, when applying a low preheat. Supplementary TL investigations indicate a distribution in activation energies for the main dosimetric (190 degrees C) peak and that the lower temperature part could fade with a higher rate than the higher temperature part. Consequences for the applied preheat treatment prior to dose measurement are discussed.
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Publication type
Article: Journal article
Document type
Scientific Article
Keywords
Accident dosimetry; Retrospective dosimetry; Portable electronic devices; Emergency dosimeter; Optically stimulated luminescence; Thermoluminescence
ISSN (print) / ISBN
1350-4487
e-ISSN
1879-0925
Journal
Radiation Measurements
Quellenangaben
Volume: 45,
Issue: 3-6,
Pages: 746-748
Publisher
Elsevier
Reviewing status
Peer reviewed
Institute(s)
Institute of Radiation Protection (ISS)