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Wittmaack, K.
Analytical description of the sputtering yields of silicon bombarded with normally incident ions.
Phys. Rev. B Condens. Matter
68
, 235211/1-235211-11 (2003)
as soon as is submitted to ZB.
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Article: Journal article
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0163-1829
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1095-3795
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Physical Review B
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Volume: 68,
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Pages: 235211/1-235211-11
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American Physical Society (APS)
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