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Artifact-free deconvolution in light field microscopy.
Opt. Express. 27, 31644-31666 (2019)
The sampling patterns of the light field microscope (LFM) are highly depth-dependent, which implies non-uniform recoverable lateral resolution across depth. Moreover, reconstructions using state-of-the-art approaches suffer from strong artifacts at axial ranges, where the LFM samples the light field at a coarse rate. In this work, we analyze the sampling patterns of the LFM, and introduce a flexible light field point spread function model (LFPSF) to cope with arbitrary LFM designs. We then propose a novel aliasing-aware deconvolution scheme to address the sampling artifacts. We demonstrate the high potential of the proposed method on real experimental data.
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Publication type
Article: Journal article
Document type
Scientific Article
Keywords
Image-reconstruction
ISSN (print) / ISBN
1094-4087
e-ISSN
1094-4087
Journal
Optics Express
Quellenangaben
Volume: 27,
Issue: 22,
Pages: 31644-31666
Publisher
Optical Society of America (OSA)
Publishing Place
2010 Massachusetts Ave Nw, Washington, Dc 20036 Usa
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Reviewing status
Peer reviewed